"patRoon 2.0: Improved non-target analysis workflows including automated ..."

Rick Helmus et al. (2022)

> Home

Details and statistics

DOI: 10.21105/JOSS.04029

access: open

type: Journal Article

metadata version: 2023-08-04

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/jossw/HelmusVBLWS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jossw/HelmusVBLWS22
Rick Helmus, Bas van de Velde, Andrea M. Brunner, Thomas L. ter Laak, Annemarie P. van Wezel, Emma Schymanski:
patRoon 2.0: Improved non-target analysis workflows including automated transformation product screening. J. Open Source Softw. 7(71): 4029 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.