"Comprehensive Analysis on the Internal Power Dissipation of Static CMOS ..."

Alejandro Millán et al. (2010)

> Home

Details and statistics

DOI: 10.1166/JOLPE.2010.1059

access: closed

type: Journal Article

metadata version: 2020-11-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jolpe/MillanBJGRV10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jolpe/MillanBJGRV10
Alejandro Millán, Manuel J. Bellido, Jorge Juan, David Guerrero Martos, Paulino Ruiz-de-Clavijo, Julian Viejo:
Comprehensive Analysis on the Internal Power Dissipation of Static CMOS Cells in Ultra-Deep Sub-Micron Technologies. J. Low Power Electron. 6(1): 93-102 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.