"Low Power Test Generation for Path Delay Faults."

Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas (2005)

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DOI: 10.1166/JOLPE.2005.019

access: closed

type: Journal Article

metadata version: 2020-05-22

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Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas:
Low Power Test Generation for Path Delay Faults. J. Low Power Electron. 1(2): 194-205 (2005)

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