"PVT: Unified Reduction of Test Power, Volume, and Test Time Using ..."

Zhen Chen et al. (2010)

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DOI: 10.1166/JOLPE.2010.1088

access: closed

type: Journal Article

metadata version: 2020-05-22

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Zhen Chen, Sharad C. Seth, Dong Xiang, Bhargab B. Bhattacharya:
PVT: Unified Reduction of Test Power, Volume, and Test Time Using Double-Tree Scan Architecture. J. Low Power Electron. 6(3): 457-468 (2010)

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