"Is the Error-related Negativity Amplitude Related to Error Detectability? ..."

Martin E. Maier, Marco Steinhauser, Ronald Hübner (2008)

Details and statistics

DOI: 10.1162/JOCN.2008.20159

access: closed

type: Journal Article

metadata version: 2020-06-18

a service of  Schloss Dagstuhl - Leibniz Center for Informatics