"Defect Detection from Multi-frequency Limited Data via Topological ..."

José Félix Funes et al. (2016)

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DOI: 10.1007/S10851-015-0611-Y

access: closed

type: Journal Article

metadata version: 2020-06-15

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José Félix Funes, José Manuel Perales, María-Luisa Rapún, José M. Vega:
Defect Detection from Multi-frequency Limited Data via Topological Sensitivity. J. Math. Imaging Vis. 55(1): 19-35 (2016)

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