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"A heuristic fault based optimization approach to reduce test vectors count ..."
Vinod Kumar Khera, R. K. Sharma, A. K. Gupta (2019)
- Vinod Kumar Khera, R. K. Sharma, A. K. Gupta:
A heuristic fault based optimization approach to reduce test vectors count in VLSI testing. J. King Saud Univ. Comput. Inf. Sci. 31(2): 229-234 (2019)
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