"Tester Structure Expression Language and Its Application to the ..."

Masayuki Sato et al. (2008)

> Home

Details and statistics

DOI: 10.3745/JIPS.2008.4.4.121

access: open

type: Journal Article

metadata version: 2021-02-16

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/jips/SatoWAIIA08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jips/SatoWAIIA08
Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa:
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. J. Inf. Process. Syst. 4(4): 121-132 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.