"Multi-stage few-shot micro-defect detection of patterned OLED panel using ..."

Shujiao Ye et al. (2024)

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DOI: 10.1007/S10845-023-02168-3

access: closed

type: Journal Article

metadata version: 2024-08-02

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Shujiao Ye, Zheng Wang, Pengbo Xiong, Xinhao Xu, Lintong Du, Jiubin Tan, Weibo Wang:
Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network. J. Intell. Manuf. 35(6): 2653-2669 (2024)

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