"A novel hypergraph convolution network for wafer defect patterns ..."

Yuxi Xie et al. (2024)

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DOI: 10.1007/S10845-022-02067-Z

access: closed

type: Journal Article

metadata version: 2024-02-29

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Yuxi Xie, Shaofan Li, C. T. Wu, Zhipeng Lai, Miao Su:
A novel hypergraph convolution network for wafer defect patterns identification based on an unbalanced dataset. J. Intell. Manuf. 35(2): 633-646 (2024)

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