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"GAN-based statistical modeling with adaptive schemes for surface defect ..."

Zhenshuang Wu et al. (2024)

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DOI: 10.1007/S10845-023-02146-9

access: closed

type: Journal Article

metadata version: 2024-04-15

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Zhenshuang Wu, Nian Cai, Kaiqiong Chen, Hao Xia, Shuai Zhou, Han Wang:
GAN-based statistical modeling with adaptive schemes for surface defect inspection of IC metal packages. J. Intell. Manuf. 35(4): 1811-1824 (2024)

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