"Shape prior guided defect pattern classification and segmentation in wafer ..."

Rui Wang, Songhao Wang, Ben Niu (2025)

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DOI: 10.1007/S10845-023-02242-W

access: closed

type: Journal Article

metadata version: 2025-01-23

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Rui Wang, Songhao Wang, Ben Niu:
Shape prior guided defect pattern classification and segmentation in wafer bin maps. J. Intell. Manuf. 36(1): 319-330 (2025)

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