"Failure time prediction for mechanical device based on the degradation ..."

Yuanhang Wang et al. (2015)

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DOI: 10.1007/S10845-013-0849-4

access: closed

type: Journal Article

metadata version: 2022-12-07

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Yuanhang Wang, Chao Deng, Jun Wu, Yao Xiong:
Failure time prediction for mechanical device based on the degradation sequence. J. Intell. Manuf. 26(6): 1181-1199 (2015)

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