"Effective automatic defect classification process based on CNN with ..."

Myeongso Kim et al. (2020)

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DOI: 10.1007/S10845-019-01502-Y

access: closed

type: Journal Article

metadata version: 2025-02-10

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Myeongso Kim, Minyoung Lee, Minjeong An, Hongchul Lee:
Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel. J. Intell. Manuf. 31(5): 1165-1174 (2020)

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