"Bayesian network for integrated circuit testing probe card fault diagnosis ..."

Wenhan Fu, Chen Fu Chien, Lizhen Tang (2022)

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DOI: 10.1007/S10845-020-01680-0

access: closed

type: Journal Article

metadata version: 2022-04-09

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Wenhan Fu, Chen Fu Chien, Lizhen Tang:
Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study. J. Intell. Manuf. 33(3): 785-798 (2022)

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