"An improved software defect prediction model based on grey incidence ..."

Shu Zhang, Yuhong Wang (2022)

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DOI: 10.3233/JIFS-213570

access: closed

type: Journal Article

metadata version: 2022-10-11

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Shu Zhang, Yuhong Wang:
An improved software defect prediction model based on grey incidence analysis and Naive Bayes algorithm. J. Intell. Fuzzy Syst. 43(5): 6047-6060 (2022)

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