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ORCID"Fault diagnosis in semiconductor manufacturing processes using a CNN-based ..."
Palanichamy Naveen et al. (2024)
- Palanichamy Naveen
, S. Nithyasai, Venkateshkumar Udayamoorthy, S. R. Ashok Kumar:
Fault diagnosis in semiconductor manufacturing processes using a CNN-based generative adversarial network1. J. Intell. Fuzzy Syst. 46(1): 1789-1800 (2024)
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