"The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the ..."

Hak-Kee Jung (2012)

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DOI: 10.6109/JICCE.2012.10.2.200

access: open

type: Journal Article

metadata version: 2021-02-16

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Hak-Kee Jung:
The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping Distribution. J. Inform. and Commun. Convergence Engineering 10(2): 200-204 (2012)

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