"Deep learning contour-based method for semi-automatic annotation of ..."

Isaac Wilfried Sanou et al. (2024)

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DOI: 10.1117/1.JEI.33.3.031204

access: closed

type: Journal Article

metadata version: 2025-01-19

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Isaac Wilfried Sanou, Julien Baderot, Stéphanie Bricq, Yannick Benezeth, Franck Marzani, Sergio Martinez, Johann Foucher:
Deep learning contour-based method for semi-automatic annotation of manufactured objects in electron microscopy images. J. Electronic Imaging 33(3) (2024)

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