"Improved image forgery localization method from a statistical perspective."

Lei Liu et al. (2023)

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DOI: 10.1117/1.JEI.32.6.063006

access: closed

type: Journal Article

metadata version: 2023-12-11

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Lei Liu, Peng Sun, Yubo Lang, Jingjiao Li, Hong Guo, Qimeng Lu:
Improved image forgery localization method from a statistical perspective. J. Electronic Imaging 32(6) (2023)

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