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"New automatic defect classification algorithm based on a ..."
Sang-Hak Lee, Hyung Il Koo, Nam Ik Cho (2010)
- Sang-Hak Lee, Hyung Il Koo, Nam Ik Cho:
New automatic defect classification algorithm based on a classification-after-segmentation framework. J. Electronic Imaging 19(2): 020502 (2010)
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