"Novel Complete Probabilistic Models of Random Variation in High Frequency ..."

Rawid Banchuin (2013)

> Home

Details and statistics

DOI: 10.1155/2013/189436

access: open

type: Journal Article

metadata version: 2020-05-20

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/jece/Banchuin13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jece/Banchuin13
Rawid Banchuin:
Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET. J. Electr. Comput. Eng. 2013: 189436:1-189436:10 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.