"A test pattern for quality control of laser scanner and charge-coupled ..."

Ethan J. Halpern (1995)

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DOI: 10.1007/BF03168050

access: closed

type: Journal Article

metadata version: 2020-07-09

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Ethan J. Halpern:
A test pattern for quality control of laser scanner and charge-coupled device film digitizers. J. Digit. Imaging 8(1): 3-9 (1995)

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