"The methodology of testability prediction for sequential circuits."

Shiyi Xu, Gercy P. Dias (1996)

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DOI: 10.1007/BF02951616

access: closed

type: Journal Article

metadata version: 2017-05-28

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Shiyi Xu, Gercy P. Dias:
The methodology of testability prediction for sequential circuits. J. Comput. Sci. Technol. 11(6): 529-541 (1996)

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