"Delay Testing Viability of Gate Oxide Short Defects."

Jean Marc Gallière et al. (2005)

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DOI: 10.1007/S11390-005-0195-X

access: closed

type: Journal Article

metadata version: 2017-05-28

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Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand:
Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)

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