"Compases: an Optimized Design for Testability Scheme to Reduce the Cost of ..."

José M. Solana (2007)

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DOI: 10.1142/S0218126607003678

access: closed

type: Journal Article

metadata version: 2020-08-25

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José M. Solana:
Compases: an Optimized Design for Testability Scheme to Reduce the Cost of Test Application Using Parallel-Serial Scan Design. J. Circuits Syst. Comput. 16(3): 467-488 (2007)

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