"Mole Fraction and Device Reliability Analysis of ..."

Km Sucheta Singh, Satyendra Kumar (2024)

> Home

Details and statistics

DOI: 10.1142/S0218126624502128

access: closed

type: Journal Article

metadata version: 2024-09-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jcsc/SinghK24a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcsc/SinghK24a
Km Sucheta Singh, Satyendra Kumar:
Mole Fraction and Device Reliability Analysis of Vertical-Tunneling-Attributed Dual-Material Double-Gate Heterojunction-TFET with Si0.7Ge0.3 Source Region at Device and Circuit Level. J. Circuits Syst. Comput. 33(12): 2450212:1-2450212:22 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.