"Novel Test Generation Algorithm for Combination Circuits."

Kaamran Raahemifar, Majid Ahmadi (2000)

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DOI: 10.1142/S0218126600000081

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type: Journal Article

metadata version: 2020-08-25

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Kaamran Raahemifar, Majid Ahmadi:
Novel Test Generation Algorithm for Combination Circuits. J. Circuits Syst. Comput. 10(1-2): 27-66 (2000)

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