"Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source ..."

Kaushal Nigam, Vinay Anand Tikkiwal, Mukesh Kumar Bind (2023)

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DOI: 10.1142/S0218126623502523

access: closed

type: Journal Article

metadata version: 2024-04-01

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Kaushal Nigam, Vinay Anand Tikkiwal, Mukesh Kumar Bind:
Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations. J. Circuits Syst. Comput. 32(15): 2350252:1-2350252:31 (2023)

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