"A Simple and Efficient Charge Injection Error Compensation Structure for ..."

Saeed Naghavi et al. (2018)

> Home

Details and statistics

DOI: 10.1142/S021812661850130X

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jcsc/NaghaviNSKAKS18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcsc/NaghaviNSKAKS18
Saeed Naghavi, Mojde Nematzade, Niloofar Sharifi, Tohid Moradi Khanshan, Adib Abrishamifar, Ziaaddin Daie Kuzekanani, Jafar Sobhi:
A Simple and Efficient Charge Injection Error Compensation Structure for MOS Sampling Switches. J. Circuits Syst. Comput. 27(8): 1850130:1-1850130:18 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.