"An Effective Test Algorithm and Diagnostic Implementation for Embedded ..."

Ze-Wang Chen, Jian-Hua Su, You-Ren Wang (2011)

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DOI: 10.1142/S0218126611007931

access: closed

type: Journal Article

metadata version: 2024-10-06

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Ze-Wang Chen, Jian-Hua Su, You-Ren Wang:
An Effective Test Algorithm and Diagnostic Implementation for Embedded Static Random Access Memories. J. Circuits Syst. Comput. 20(7): 1389-1402 (2011)

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