"Multi-tone waveform Measurement System Enabling Characterization of ..."

Muhammad Akmal Chaudhary et al. (2014)

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DOI: 10.1142/S0218126614501412

access: closed

type: Journal Article

metadata version: 2022-10-02

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Muhammad Akmal Chaudhary, Jonathan Lees, Johannes Benedikt, Paul J. Tasker:
Multi-tone waveform Measurement System Enabling Characterization of microwave Devices. J. Circuits Syst. Comput. 23(10) (2014)

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