default search action
"Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET."
Jyi-Tsong Lin, Yi-Chuen Eng (2008)
- Jyi-Tsong Lin, Yi-Chuen Eng:
Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. J. Comput. 3(5): 41-45 (2008)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.