"Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, ..."

Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min (2008)

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DOI: 10.4304/JCP.3.3.39-47

access: closed

type: Journal Article

metadata version: 2020-09-15

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Duk-Hyung Lee, Dong-Kone Kwak, Kyeong-Sik Min:
Comparative Study on Leakage Current of Power-Gated SRAMs for 65-nm, 45-nm, 32-nm Technology Nodes. J. Comput. 3(3): 39-47 (2008)

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