"Reliability analysis for multi-level stress testing with Weibull ..."

Zaizai Yan et al. (2018)

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DOI: 10.1016/J.CAM.2017.05.048

access: closed

type: Journal Article

metadata version: 2020-02-20

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Zaizai Yan, Tiefeng Zhu, Xiuyun Peng, Xiaoyan Li:
Reliability analysis for multi-level stress testing with Weibull regression model under the general progressively Type-II censored data. J. Comput. Appl. Math. 330: 28-40 (2018)

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