"Reliability nonparametric Bayesian estimation for the masked data of ..."

Bin Liu et al. (2017)

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DOI: 10.1016/J.CAM.2016.07.029

access: open

type: Journal Article

metadata version: 2021-02-16

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Bin Liu, Yimin Shi, Fode Zhang, Xuchao Bai:
Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests. J. Comput. Appl. Math. 311: 375-386 (2017)

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