"Corrigendum to 'Technostress causes cognitive overload in high-stress ..."

Se Young Kim et al. (2023)

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DOI: 10.1016/J.IPM.2023.103346

access: open

type: Journal Article

metadata version: 2023-09-12

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Se Young Kim, Hahyeon Park, Hongbum Kim, Joon Kim, Kyoungwon Seo:
Corrigendum to 'Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test'; Information Processing & Management 59 (2022) 103093 /6. Inf. Process. Manag. 60(4): 103346 (2023)

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