"An improved testing scheme for catastrophic fault patterns."

Amiya Nayak, Jiajun Ren, Nicola Santoro (2000)

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DOI: 10.1016/S0020-0190(00)00012-0

access: closed

type: Journal Article

metadata version: 2024-05-07

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Amiya Nayak, Jiajun Ren, Nicola Santoro:
An improved testing scheme for catastrophic fault patterns. Inf. Process. Lett. 73(5-6): 199-206 (2000)

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