Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"An improved testing scheme for catastrophic fault patterns."

Amiya Nayak, Jiajun Ren, Nicola Santoro (2000)

> Home

Details and statistics

DOI: 10.1016/S0020-0190(00)00012-0

access: closed

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ipl/NayakRS00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ipl/NayakRS00
Amiya Nayak, Jiajun Ren, Nicola Santoro:
An improved testing scheme for catastrophic fault patterns. Inf. Process. Lett. 73(5-6): 199-206 (2000)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.