"An Empirical Study of High-Risk Vulnerabilities in IoT Systems."

Xiang Chen et al. (2025)

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DOI: 10.1109/JIOT.2024.3506976

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type: Journal Article

metadata version: 2025-01-26

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Xiang Chen, Changlin Yang, Yuhong Nan, Zibin Zheng:
An Empirical Study of High-Risk Vulnerabilities in IoT Systems. IEEE Internet Things J. 12(2): 1590-1601 (2025)

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