"A New and Fast Approach to Very Large Scale Integrated Sequential Circuit ..."

J. B. Adams, Dorit S. Hochbaum (1997)

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DOI: 10.1287/OPRE.45.6.842

access: closed

type: Journal Article

metadata version: 2020-03-31

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J. B. Adams, Dorit S. Hochbaum:
A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation. Oper. Res. 45(6): 842-856 (1997)

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