"Yielding optimized dependability assurance through bit inversion."

Jiangwei Zhang et al. (2019)

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DOI: 10.1016/J.VLSI.2018.09.002

access: closed

type: Journal Article

metadata version: 2020-02-20

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Jiangwei Zhang, Donald Kline Jr., Liang Fang, Rami G. Melhem, Alex K. Jones:
Yielding optimized dependability assurance through bit inversion. Integr. 64: 105-113 (2019)

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