"BJT induced dark current in CMOS image sensors."

Shuang Xie (2022)

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DOI: 10.1016/J.VLSI.2022.07.013

access: closed

type: Journal Article

metadata version: 2022-10-18

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Shuang Xie:
BJT induced dark current in CMOS image sensors. Integr. 87: 260-263 (2022)

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