"Exploiting distribution of unknown values in test responses to optimize ..."

Sying-Jyan Wang, Kuan-Ting Yeh, Katherine Shu-Min Li (2019)

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DOI: 10.1016/J.VLSI.2017.12.008

access: closed

type: Journal Article

metadata version: 2021-10-14

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Sying-Jyan Wang, Kuan-Ting Yeh, Katherine Shu-Min Li:
Exploiting distribution of unknown values in test responses to optimize test output compactors. Integr. 65: 389-394 (2019)

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