"Failure probability analysis and critical node determination for ..."

Zhen Wang, Jianhui Jiang, Tao Wang (2019)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2019.05.008

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/WangJW19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/WangJW19
Zhen Wang, Jianhui Jiang, Tao Wang:
Failure probability analysis and critical node determination for approximate circuits. Integr. 68: 122-128 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.