"Surrogating circuit design solutions with robustness metrics."

Jin Sun et al. (2016)

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DOI: 10.1016/J.VLSI.2015.07.015

access: closed

type: Journal Article

metadata version: 2022-03-16

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Jin Sun, Liang Xiao, Jiangshan Tian, He Zhou, Janet Roveda:
Surrogating circuit design solutions with robustness metrics. Integr. 52: 1-9 (2016)

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