"A simple built-in current sensor for IDDQ testing of CMOS data converters."

Ashok K. Srivastava, Srinivas Rao Aluri, Anand Kumar Chamakura (2005)

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DOI: 10.1016/J.VLSI.2004.10.002

access: closed

type: Journal Article

metadata version: 2020-02-20