"Reducing test application time, test data volume and test power through ..."

José M. Solana (2009)

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DOI: 10.1016/J.VLSI.2008.12.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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José M. Solana:
Reducing test application time, test data volume and test power through Virtual Chain Partition. Integr. 42(3): 385-399 (2009)

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