"Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL ..."

Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon (2002)

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DOI: 10.1016/S0167-9260(02)00043-3

access: closed

type: Journal Article

metadata version: 2021-01-20

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Donald B. Shaw, Dhamin Al-Khalili, Côme Rozon:
Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integr. 32(1-2): 77-97 (2002)

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