"An on-chip frequency programmable test clock generation and application ..."

Songwei Pei et al. (2015)

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DOI: 10.1016/J.VLSI.2014.12.003

access: closed

type: Journal Article

metadata version: 2023-05-11

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Songwei Pei, Huawei Li, Song Jin, Jun Liu, Xiaowei Li:
An on-chip frequency programmable test clock generation and application method for small delay defect detection. Integr. 49: 87-97 (2015)

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