"Electromigration assessment for power grid networks considering ..."

Xin Huang et al. (2016)

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DOI: 10.1016/J.VLSI.2016.04.001

access: closed

type: Journal Article

metadata version: 2020-02-20

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Xin Huang, Valeriy Sukharev, Jun-Ho Choy, Marko Chew, Taeyoung Kim, Sheldon X.-D. Tan:
Electromigration assessment for power grid networks considering temperature and thermal stress effects. Integr. 55: 307-315 (2016)

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